Science and technology often need to be associated to face the most demanding challenges. We have developed a new STM/AFM in UHV conditions specifically designed to measure, with atomic resolution, the same region of the sample from 3K to 400K, as well as measure the macroscopic electronic transport properties of the sample. In this way, we will try to achieve a really demanding goal: a systematic one by one correlation of the sample morphology with macroscopic transport measurements​